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Národní úložiště šedé literatury Nalezeno 2 záznamů.  Hledání trvalo 0.00 vteřin. 
Determination of thickness refinement using STEM detector segments
 Skoupý, Radim ; Krzyžánek, Vladislav
Quantitative STEM imaging together with Monte Carlo simulations of electron scattering in solids can bring interesting results about properties of many thin samples. It is possible to determine thickness of a sample, to calculate mass of particles and measure mass per length/area. Appropriate calibration is one of the crucial parts of the method. Even a small error or inaccuracy in detector response to electron beam either blanked or full brings significant error into thickness determination. This problem can be overcome by parallel STEM imaging in more segments of the detector. Comparing more segments gives a possibility to use a signal from different segments for different thicknesses of a sample. Accuracy of individual parts of the detector depends on the captured signal quantity. It is desirable to use such a STEM detector segment that provides the greatest signal change to a unit of thickness. To demonstrate the usage, we used a sample of Latex nanospheres placed on thin carbon lacey film, diameter of the nanospheres was around 600 nm in order to compare the results from different detector segments. Thanks to the known thickness of the sample (calculated from its geometrical shape), it is possible to estimate the optimal acquisition settings and post processing steps with the known and the true state of the sample.
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Sixty years of the Institute os Scientific Instruments
 Müllerová, Ilona
The Institute of Scientific Instruments (ISI) was established in 1957 as an institution providing instrumental equipment for other institutes of the Academy of Sciences, mainly in the field of electron microscopy, nuclear magnetic resonance and coherent optics. Three examples are shown in Figure 1. In the beginning the institute had only 83 employees, including the workshop which produced the electronics and all mechanical parts of the instruments. During the process of post-Communist transformation of the Academy of Sciences, which began in 1989, the development of entire instruments and devices was brought to a halt and scientific activities of our Institute focused on the methodology of probing the physical properties of matter in the above-mentioned main fields. New components of scientific instruments were developed that help push the limits of what hadpreviously been possible, continuing the long tradition of the Institute in these topics.
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